Cecilia Metra

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Cecilia Metra
DEIS - Università di Bologna
Viale Risorgimento, 2 - 40136 - Bologna (ITALY)


Tel: +39 051 2093038
Fax: +39-051-2093073

Biography

Cecilia Metra is an Associate Professor in Electronics of the University of Bologna (Italy). She obtained the degree (summa cum laude) in Electronic Engineering and the PhD degree in Electronic Engineering and Computer Science from the University of Bologna (Italy). From 1998 to 2001, she has also been Visiting Scholar at the University of Washington, Seattle (USA), while in 2002 she has been Visiting Faculty Consultant for Intel Corporation, Santa Clara (CA). Dr. Metra is General Co-Chair of the "The IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems" 2005 and Program Co-Chair of the "IEEE Int. On-Line Testing Symposium" 2005. She has been General Co-Chair/Program Co-Chair of the "IEEE Int. On-Line Testing Symposium", 2004, 2003, the "IEEE Int. On-Line Testing Workshop", 2002, 2001 and "The IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems", 1999, 1998. She serves/served as Topic Chair for several international conferences, including the International Test Conference and the Design, Automation and Test in Europe (DATE) Conference. She is/has been Member of the Technical Program Committee of several International Conferences, including the IEEE VLSI Test Symposium, the IEEE European Test Symposium, The IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems, the IEEE Int. Workshop on Memory Technology, Design, and Testing (MTDT), the IEEE Int. Workshop on Silicon Debug and Diagnosis and the IEEE Int. Workshop on Infrastructure IP. She a Member of the Editorial Board of the IEEE "Transactions on Computers", the "Microelectronics Journal" (Elsevier Science) and the "Journal of Electronic Testing: Theory and Applications (JETTA)" (Springer). She has been Guest Co-Editor for several Special Issues of international journals and magazines, including the IEEE Transactions on Computers, the IEEE Design & Test and the Journal of Electronic Testing: Theory and Applications (JETTA). She received an IEEE Computer Society Certificate of Appreciation in 2000 and 2004. She is/has been responsible of research contracts in collaboration with several international companies and research centers, including the Philips Research Labs (Eindhoven, The Netherlands), STMicroelectronics, the Italian Space Agency and Alstom Transport. In 2005 and 2004 she received a research grant (2005, 2004) and an equipment grant (2004) from Intel Corporation (Santa Clara, CA). See also the extended resume of Cecilia Metra.

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