University of Bologna

Dipartimento di Elettronica, Informatica e Sistemistica

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Searched for "qrei:Gol93"
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Bibtex entry:

@article{qrei:Gol93,
   keywords = {emi, circuit, opamp},
   author = {D. Golzio and S. Graffi and Zs. M. V.-Kovacs and G. Masetti},
   title="Correlation between EMI-Induced Failures and Large-Signal
          Response of FET-Input Op-Amps",
   key={qrei:Gol93},
   journal={Quality and Reliability Engineering International},
   press = {John Wiley & Sons},
   volume = {9},
   pages = {401--405},
   year = {1993},
},

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